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Pulsed High Current Testing Applications Use Reed Relays

When Test Equipment and Auto Test Equipment (ATE) systems are used to test discrete semiconductors they often require a switching device that can carry high-pulsed currents that do not distort the pulsed current. These pulsed currents are used to verify the device under test can handle high and/or surge currents without any degradation in performance. The high current pulse verifies that the chip is adequately bonded to its substrate. Also, at the same time, high voltages may be needed to hold off high switching voltages as well. Using reed relays achieves the goal of billions of successful pulsed operations.

 

Features

In excess of 1 billion operations including pulsed carry currents
Small Size
Ability to carry pulsed currents up to 5 Amps
Ability to switch up to 1000 Volts
Dielectric strength across the contacts 3000 volts
Round leads allow for better adherence when socketed
Contacts dynamically tested

Series

Series Dimensions mm inches Illustration
SIL HV W 6.35 0.250
H 8.13 0.320
L 24.13 0.950
LI W 10 0.394
H 10.4 0.409
L 30 1.181
SIL W 50.08 0.200
H 7.8 0.307
L 19.8 0.780
BE W 10 0.394
H 10 0.394
L 33 1.299

Documents and Downloads

Document File Type File Size Download
Brochure PDF 879 KB
Resources

View Meder Electronic Pages

in the RSI Online Catalog

Meder Electronic Website
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